椭圆偏振光谱技术的腐蚀研究应用

doi:10.61558/2993-074X.2129

摘要/Abstract

摘要： 椭圆偏振光谱技术是一种高度灵敏、非破坏性的原位实时表征技术，可获取腐蚀过程“电极材料-介质”界面的动态变化信息，因此在腐蚀研究中得到了广泛应用. 本文结合解析椭圆偏振光谱数据所采用的光学模型的发展，介绍了近年来椭圆偏振光谱技术在腐蚀研究中的典型应用，并分析了该技术的发展趋势.

关键词: 椭圆偏振光谱技术, 腐蚀, 界面, 光学模型

Abstract: As a highly-sensitive and non-destructive in situ technique, spectroscopic ellipsometry has been widely applied in corrosion investigation to acquire the dynamic information of the “electrode-medium” interface during corrosion. This paper lays out some representative demonstrations in several established optical models used to interpret data obtained with spectroscopic ellipsometry in corrosion investigation. In addition, the latest trends in development of this technique are analyzed.

Key words: Spectroscopic ellipsometry, corrosion, interface, optical model

中图分类号:

O646.6

李凌杰, 贺毓玲, 雷惊雷, 张胜涛. 椭圆偏振光谱技术的腐蚀研究应用[J]. 电化学（中英文）, 2013, 19(5): 402-408.

LI Ling-jie, HE Yu-ling, LEI Jing-lei, ZHANG Sheng tao. Applications of Spectroscopic Ellipsometry in Corrosion Investigation[J]. Journal of Electrochemistry, 2013, 19(5): 402-408.

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链接本文: https://electrochem.xmu.edu.cn/CN/10.61558/2993-074X.2129

https://electrochem.xmu.edu.cn/CN/Y2013/V19/I5/402

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