欢迎访问《电化学(中英文)》期刊官方网站,今天是

电化学(中英文) ›› 2013, Vol. 19 ›› Issue (5): 409-417.  doi: 10.61558/2993-074X.2130

• 腐蚀电化学及研究方法近期研究专辑(厦门大学 林昌健教授主编) • 上一篇    下一篇

金属锌表面膜形成的椭圆偏振技术研究

左娟1*,陈营2,林昌健3,Andreas Erbe2   

  1. 1. 厦门理工学院材料科学与工程学院,福建 厦门 361024;2. Max-Planck-Institut für Eisenforschung GmbH, Department of Interface Chemistry and Surface Engineering, Max-Planck-Str. 1, 40237 Düsseldorf, Germany;3. 厦门大学化学化工学院,福建 厦门 361005
  • 收稿日期:2013-02-21 修回日期:2013-04-22 出版日期:2013-10-28 发布日期:2013-04-22
  • 通讯作者: 左娟 E-mail:zuojuan@xmut.edu.cn
  • 基金资助:

    福建省自然科学基金项目(No. 2011J05143)、福建省教育厅JK类项目(No. JK2010053)、教育部留学回国人员科研启动基金(教外司留[2012]940-2)和厦门理工学院高层次人才科研启动项目(No. YKJ10027R)资助

An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry

ZUO Juan1*, CHEN Ying2, LIN Chang-jian3, ERBE Andreas2   

  1. 1. School of Materials Science and Engineering, Xiamen University of Technology, Xiamen 361024, Fujian, China; 2. Max-Planck-Institut für Eisenforschung GmbH, Department of Interface Chemistry and Surface Engineering, Max-Planck-Str. 1, 40237 Düsseldorf, Germany; 3. College of Chemistry and Chemical Engineering, Xiamen UniversityXiamen 361005, Fujian, China
  • Received:2013-02-21 Revised:2013-04-22 Published:2013-10-28 Online:2013-04-22
  • Contact: ZUO Juan E-mail:zuojuan@xmut.edu.cn

摘要: 介绍了近年作者课题组使用椭圆偏振技术研究金属锌表面氧化膜的形成,包括多晶锌表面自然氧化物薄膜的形成及其光学性能和电子结构、不同气氛自然氧化物膜的生长研究以及在碱性碳酸盐介质金属锌的电化学过程等方面的工作. 旨在通过原位和非原位椭圆偏振技术了解金属锌表面氧化物膜层的光、电性能以及膜层结构的改变和生长动力学,这对评估锌氧化层的总体性能有着重要意义.

关键词: 椭圆偏振光谱, 锌, 自然氧化物膜, 光学性质, 电学性质, 生长动力学

Abstract: The formation of natural oxide films on polycrystalline zinc surface, the growth of natural oxide films in different atmospheres, as well as the electrochemical process of metal zinc in alkaline carbonate solution, studied recently by using spectroscopic ellipsometry in our group, are introduced. The objective of this paper is to outline that the optical, electrical properties, the change and growth kinetics of zinc metal oxide film on the surface can be investigated by in-situ and ex-situ ellipsometry, which makes significant sense to evaluate the overall performance of zinc oxide layer.

Key words: spectroscopic ellipsometry, zinc, native oxide films;optical property;electronic property, growth kinetics

中图分类号: