扫描电化学微探针的发展及其在局部腐蚀研究中的应用

doi:10.61558/2993-074X.1966

摘要/Abstract

摘要： 简要概述当前国内外具有空间分辨能力的扫描微探针技术及其在腐蚀研究中的应用,包括扫描微电极技术(SMET)、扫描电化学显微镜(SECM)、原子力显微镜(AFM)、扫描Kelvin探针技术(SKP)等,其中SMET、SECM、SKP及局部交流阻抗技术可直接测定腐蚀电极表面或界面电化学不均一性的分布图像,而原子力显微镜技术则是通过分子间作用力从纳米尺寸测量腐蚀过程表面形貌的变化.文中侧重介绍作者近年先后建立的具有微米空间分辨度的电化学微探针技术,并利用各种扫描探针技术研究金属/溶液界面电化学不均一性及其局部腐蚀过程.研究表明,空间分辨电化学方法的发展及应用,加深了人们对金属表面和金属/溶液界面电化学不均一性,特别是金属局部腐蚀发生、发展及过程机理的认识.

关键词: 扫描微电极技术, 扫描隧道显微镜, 扫描电化学显微镜, 扫描Kelvin探针, 腐蚀

Abstract: The electrochemical inhomogeneities always exist at the interface of metal/solution,and play an important and often controlling role in localized corrosion of metals in a given environment.It is necessary to develop in situ imaging techniques for further studying the electrochemical and environmental inhomogeneities at the interface of metal/solution for the localized corrosion system.In this paper,various techniques with spatial resolution,such as scanning micro reference electrode(SMET),scanning electrochemical microscope(SECM),atomic force microscope(AFM),and scanning Kelvin probe(SKP),and their applications in corrosion studies were briefly reviewed.The chemical probes and array electrode have been developed.It was concentrated to describe our newly developed techniques of the scanning electrochemical probes,including SMET with highly spatial resolution combined system of SMET/STM.The development and application of the various scanning electrochemical probes are definally helpful for imaging electrochemical inhomogeneities on electrode surface and further understanding the mechanism for the localized corrosion of metals.

Key words: scanning micro reference electrode, scanning tunneling microscope, scanning electrochemical microscope, scanning Kelvinprobe, corrosion

中图分类号:

TG174

林昌健, 李彦, 林斌, 胡融刚, 张敏, 卓向东, 杜荣归, . 扫描电化学微探针的发展及其在局部腐蚀研究中的应用[J]. 电化学（中英文）, 2009, 15(2): 121-128.

LIN Chang-Jian, LI Yan, LIN Bin, HU Rong-gang, ZHANG Min, ZHUO Xiang-dong, DU Rong-gui. Developments of Scanning Electrochemical Probes and Their Applications in Studying of Localized Corrosions[J]. Journal of Electrochemistry, 2009, 15(2): 121-128.

导出引用管理器 EndNote|Ris|BibTeX

链接本文: https://electrochem.xmu.edu.cn/CN/10.61558/2993-074X.1966

https://electrochem.xmu.edu.cn/CN/Y2009/V15/I2/121

参考文献

[1]Cao Chunan.Principles of electrochemistry of corrosion[M].Beijing:Chemical Industry Press,2008. [2]Zhang Hongbao,Cong Wenbo.The electrochemical cor-rosion and protection of metal[M].Beijing:ChemicalIndustry Press,2005. [3]Tian Zhaowu.The research method in electrochemistry[M].Beijing:Science Press,1984. [4]Lin Changjian,Tian Zhaowu.Development of expei-mental method in electrochemistry[M].Xiamen:Xia-men University Press,1989.254. [5]Lsaacs HS.Vyad B.Scanning reference electrode tech-niques in localized corrosion[M]//in Eds.F MansfildF,Bertocci U.Electrichemical Corrosion Testing,ATSM STP 727,1981. [6]Lin Changjian(林昌健),Zhuo Xiangdong(卓向东),Tian Zhaowu(田昭武),et al.Study of localized corro-sion of metals by using the electrochemical techniqueswith spatial resolution[J].Electrochemistry(in Chi-nese),1999,5(1):25. [7]Lin Changjian(林昌健),Zhuo Xiangdong(卓向东),Tian Zhaowu(田昭武),et al.Novel electrochemicaltechniques with spatial resolution and its applications inthe investigation of localized corrosion[J].Journal ofXiamen University(Natural Science)(in Chinese),2001,40(2):943. [8]Lin Changjian(林昌健),Tian Zhaowu(田昭武).In-vestigation of the pitting corrosion of 18-8 stainless steelin early stage[J].Acta Physico-Chimica Sinica(in Chi-nese),1987,3(5):479-484. [9]Lin Changjian(林昌健).In situ measurement of theCl-concentration distribution of metal surface[J].Cor-rosion Science and Protection Technology,1992,4(1):35-41. [10]Martin A Edwards,Sophie Martin,Anna LWhitworth,et al.Scanning electrochemical microscopy:principlesand applications to biophysical systems[J].Physiolog-ical Measurement,2006,27:R63-R108. [11]Kathrin Eckhard,Mathieu Etienne,Albert Schulte,etal.Constant-distance mode AC-SECM for the visuali-sation of corrosion pits[J].Electrochemistry Commu-nications,2007,9(7):1793-1797. [12]Gabrielli C,Ostermann E,Perrot H,et al.Concentra-tion mapping around copper microelectrodes studied byscanning electrochemical microscopy[J].Electro-chemistry Communications,2007,7:962-968. [13]Geraint Williams,Neil McMurray.Latent fingermarkvisualisation using a scanning Kelvin probe[J].Foren-sic Science International,2007,167:102-109. [14]Castaldini A,Cavalcoli D,Cavallini A.Scanning Kel-vin probe and surface photovoltage analysis of multic-rystalline silicon[J].Materials Science and Engineer-ing,2002,B91-92:234-238. [15]Binnig G,Rohrer H,Gerber Ch,et al.Tunnelingthrough a controllable vacuum gap[J].Appl PhysLett,1982,40:178-180. [16]Binnig G,Rohrer H,Gerber Ch,et al.Surface stud-ies by scanning sunneling sicroscopy[J].Phys RevLett,1982,49:57-61. [17]Eigler D M,Schweizer E K.Positioning single atomswith a scanning tunnelling microscope[J].Nature,1990,344:524-526. [18]Gimzewskia J K,Stolla E,Schlittlera R R.Scanningtunneling microscopy of individual molecules of copperphthalocyanine adsorbed on polycrystalline silver sur-faces[J].Surface Science,1987,181:267. [19]Cuberes M T,Schlittler R R,Gimzewski J K.Roomtemperature supramolecular repositioning at molecularinterfaces using a scanning tunneling microscope[J].Surface Science,1997,371:L231. [20]Gimzewski J K,Jung TA,Cuberes MT,et al.Scan-ning tunneling microscopy of individual molecules:be-yond imaging[J].Surface Science,1997,386(1/3):101-114. [21]Mitsuoka Y,Nakajima K,Homma K,et al.Polariza-tion properties of light emitted by a bent optical fiberprobe and polarization contrast in scanning near-fieldoptical microscopy[J].Journal of Applied Physics,1998,83(8):3998-4003. [22]Nakajima K,Micheletto R,Mitsui K,et al.Hybrid-ization of scanning near-field optical microscope withscanning tunneling microscope[J].Molecular Crystalsand Liquid Crystals,1999,327:241-244. [23]Heimel J,Fischer UC,Fuchs H.SNOM/STMusing atetrahedral tip and a sensitive current-to-voltage con-verter[J].Journal of Microscopy-oxford,2001,202:53-59. [24]Gullo MR,Frederix Pltm,Akiyama T,et al.Charac-terization of microfabricated probes for combined atomicforce and high-resolution scanning electrochemical mi-croscopy[J].Analytical Chemistry,2006,78(15):5436-5442. [25]Wiedemair J,Balu B,Moon J S,et al.,Plasma-de-posited fluorocarbon films:Insulation material for mi-croelectrodes and combined atomic force microscopy-scanning electrochemical microscopy probes[J].Ana-lytical Chemistry,2008,80(13):5260-5265. [26]Davoodi A,Pan J,Leygraf C,et al.Integrated AFMand SECM for in situ studies of localized corrosion ofAl alloys[J].Electrochimica Acta,2007,52(27):7697-7705. [27]Davoodi A,Pan J,Leygraf C,et al.The role of inter-metallic particles in localized corrosion of an aluminumalloy studied by SKPFM and integrated AFM/SECM[J].Journal of Electrochemical Society,2008,155(5):C211-C218. [28]Femenia M,Canalias C,Pan J,et al.Scanning Kel-vin probe force microscopy and magnetic force micros-copy for characterization of duplex stainless steels[J].Journal of Electrochemical Society,2003,150(6):B274-B281. [29]Lin Changjian(林昌健),Wei Baoming(魏宝明),Wang Ying(汪鹰),et al.Pitting corrosion and its in-hibition of rebar in alkaline solution containing chlorideions studied by reference electrode technique[J].Cor-rosion Science and Protection Technology,1998,10(3):135-139. [30]Lin Changjian(林昌健),Luo Jingli(骆静利),DuRonggui(杜荣归),et al.Scanning combination of pHelectrode for in-situ pHimaging in the localized corro-sion[J].Electrochemistry(in Chinese),1996,2(4):372-377. [31]Du Ronggui(杜荣归),Li Yan(李彦),Lin Changjian(林昌健),et al.Study on localized corrosion behav-ior of reinforcing steel by scanning microelectrode tech-nique[J].Journal of Building Materials,2008,11(1):33-37. [32]Lin Yuhua(林玉华),Shao Minhua(邵敏华),DuRonggui(杜荣归),et al.Fabrication of scanning mi-cro Cl-probe and in-situ imaging of Cl-at the inter-face of 2024 Al alloy/solution[J].Electrochemistry(inChinese),2003,9(3):280-286.