7075铝合金在电解液薄层下的电位波动

电化学（中英文） ›› 2005, Vol. 11 ›› Issue (2): 167-171.

7075铝合金在电解液薄层下的电位波动

陈素晶,袁庆铭,何建平,刘晓磊

南京航空航天大学材料科学与技术学院,厦门航空有限公司,南京航空航天大学材料科学与技术学院,南京航空航天大学材料科学与技术学院江苏南京,210016 ,福建厦门,361009 ,江苏南京,210016 ,江苏南京,210016

收稿日期:2005-05-28 修回日期:2005-05-28 出版日期:2005-05-28 发布日期:2005-05-28

Potential Fluctuations of 7075 Aluminum Alloy under Thin Electrolyte Layers

CHEN Su-jing~

(1) ,YUAN Qing-ming~(2), HE Jian-ping~(1),LIU Xiao-lei~(1)( College of Material Science and Technology of Nanjng University of Aeronauticsand Astronautics, Nanjing, 210016,China,2.Xiamen Airlines Ltd. Xiamen 361009, China

Received:2005-05-28 Revised:2005-05-28 Published:2005-05-28 Online:2005-05-28

摘要/Abstract

摘要： 在3.5%NaCl电解液膜下,7075铝合金自腐蚀电位随浸泡时间的波动呈如下变化:浸泡初期,自腐蚀电位E波动的幅度极小,继续浸泡至4h后E急剧增大到20mV,而浸泡6h后的波动幅度与腐蚀初期相近,但出现了正向尖峰,至12h后的波动幅度又与4h的相当.实验发现自腐蚀电位的均方差随腐蚀时间呈先负移而后正移的趋势,4h时出现极小值.而电位功率谱密度线性部分的斜率(k),则在4h时呈现较小值,6h时出现最大值.由此推断7075铝合金在薄电解液膜下浸泡6h后其表面产生了稳定的蚀点.

关键词: 铝合金, 薄电解液层, 电位波动, 点蚀

Abstract: Lens tissues adsorbing 3.5% sodium chloride solution were used to simulate thin electrolyte layers. The 7075 aluminum alloy was immersed under the thin electrolyte layers for 0, 4, 6, 8 and 12 h respectively. Then the fluctuations of natural-corrosion potentials of the alloy were monitored. The fluctuations of natural-corrosion potential were observed rather small in the initial corrosion stages after 6h immersion, and the positive peaks of potential appeared. However the amplitudes reached 20mV after 4h and 12h immersion. The RMS of natural-corrosion potentials decreased with corrosion time at first and then increased. It reached a minimum at 4 h. The k value (slope of linear part) was rather high at 6h. Thus it can conclude from above that the initiation of pitting happened after 6h corrosion.

Key words: Aluminum alloy, Thin electrolyte layers, Potential fluctuations, Pitting

中图分类号:

TG174

陈素晶,袁庆铭,何建平,刘晓磊. 7075铝合金在电解液薄层下的电位波动[J]. 电化学（中英文）, 2005, 11(2): 167-171.

CHEN Su-jing~. Potential Fluctuations of 7075 Aluminum Alloy under Thin Electrolyte Layers[J]. Journal of Electrochemistry, 2005, 11(2): 167-171.

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链接本文: https://electrochem.xmu.edu.cn/CN/

https://electrochem.xmu.edu.cn/CN/Y2005/V11/I2/167

参考文献

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