在线原位观察电镀镍磷合金镀液光亮剂的作用

电化学（中英文） ›› 2006, Vol. 12 ›› Issue (1): 98-103.

在线原位观察电镀镍磷合金镀液光亮剂的作用

郑剑;李宁;黎德育;崔国锋;

哈尔滨工业大学应用化学系,哈尔滨工业大学应用化学系,哈尔滨工业大学应用化学系,哈尔滨工业大学应用化学系黑龙江哈尔滨150001,黑龙江哈尔滨150001,黑龙江哈尔滨150001,黑龙江哈尔滨150001

收稿日期:2006-02-28 修回日期:2006-02-28 出版日期:2006-02-28 发布日期:2006-02-28

In-situ Detection of the Effect of Brighter in the Solution for Nickel and Phosphor Alloy

ZHENG Jian~*,LI Ning,LI De-yu,CUI Guo-feng

(Department of Applied Chemistry,Haerbin Institute of Technology,Haerbin 150001,Heilongjiang,China

Received:2006-02-28 Revised:2006-02-28 Published:2006-02-28 Online:2006-02-28

摘要/Abstract

摘要： 以喷金云母片为基体,浓度为正常镀液5%的电镀镍液作母液,应用电化学扫描隧道显微镜在纳米尺度范围内在线原位观察光亮剂对镀层微观形貌的影响.实验发现,对不加光亮剂的镀液,所得镀层尽管无光亮性,但镀后的粗糙度与峰谷值HA-V明显降低;加有全光亮性光亮剂的镀液,虽可得到全光亮镀层,但其粗糙度与峰谷值HA-V却增加了,半光亮剂对峰谷值与光亮性的影响处于以上两者之间,证明光亮剂的作用机理不是微观整平作用,纳米尺度内的微观整平性与镀液的光亮性没有必然的联系.

关键词: 电化学隧道显微镜, 光亮剂, 在线原位观测, 微观整平作用, 粗糙度

Abstract: In this work,the gold-plated mica was used for the substrate,the concentration of 5% of normal plating solution for the nickel was used as the mother solution,and the effect for the deposition by the brighter with ECSTM was in-situ detected.The solution for deposition without the brighter has no brightness,though the values of the roughness and the H_(A-V) have reduced in evidence after deposition;the solution for deposition with the complete brighter although has great brightness,the values of the roughness and the H_(A-V) have increased(after) deposition;the solution for deposition with the half brighter has a moderate effect on the H_(A-V) and (brightness).Hence,the brighter effect is not the micro-leveling effect,and the micro-leveling effect has no direct relation with the brightness.

Key words: ECSTM, Brighter, In-situ, Micro-leveling effect, Roughness

中图分类号:

TQ153.2

郑剑;李宁;黎德育;崔国锋;. 在线原位观察电镀镍磷合金镀液光亮剂的作用[J]. 电化学（中英文）, 2006, 12(1): 98-103.

ZHENG Jian~*,LI Ning,LI De-yu,CUI Guo-feng. In-situ Detection of the Effect of Brighter in the Solution for Nickel and Phosphor Alloy[J]. Journal of Electrochemistry, 2006, 12(1): 98-103.

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https://electrochem.xmu.edu.cn/CN/Y2006/V12/I1/98

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