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电化学(中英文) ›› 2004, Vol. 10 ›› Issue (1): 94-97. 

• 研究论文 • 上一篇    下一篇

硫脲对镍电沉积的作用

胡光辉,吴辉煌,杨防祖,王森林   

  1. 厦门大学化学化工学院固体表面物理化学国家重点实验室,厦门大学化学化工学院固体表面物理化学国家重点实验室,厦门大学化学化工学院固体表面物理化学国家重点实验室,厦门大学化学化工学院固体表面物理化学国家重点实验室 福建厦门361005 ,福建厦门361005 ,福建厦门361005 ,福建厦门361005
  • 收稿日期:2004-02-28 修回日期:2004-02-28 出版日期:2004-02-28 发布日期:2004-02-28

Effect of Thiourea on Nickel Deposition

HU Guang-hui,WU Hui-huang~,YANG Fang-zu,WANG Sheng-lin ical Chemistry of Solid Surfaces, Xiamen University,Xiamen 361005,China)   

  • Received:2004-02-28 Revised:2004-02-28 Published:2004-02-28 Online:2004-02-28

摘要:  应用循环伏安和阻抗_电位法研究了硫脲(TU)对玻碳电极和镀镍玻碳电极上镍沉积过程的影响.结果表明,在玻碳电极上镍的电沉积呈现明显的电化学成核机理,而在镀镍玻碳电极上则无此特征.TU的存在虽阻碍了Ni晶核的形成,但却能加速晶粒的生长.

关键词: 硫脲, 电沉积镍, 速控步骤, 阻抗_电位曲线

Abstract: Effect of thiourea on nickel deposition at glassy carbon and nickel-deposited glass carbon electrodes was investigated with cyclic voltammograms and impetance-potential curves. It was found that the nucleation processes occurred at the glassy carbon electrode. However, this characteristics disappeared at the nicked-deposited glassy carbon electrode. It was suggested that the presence of thiourea hindered the nucleation processes, yet accelerated grain growth.Curves of impetance-potential could sensitively detect effect of thiourea on nickel depositon and reflect changes in rate-determining step with potential.

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