椭圆偏振测量技术是通过解析偏振光束在界面上或薄膜中反射或透射时偏振状态的变化，获取界面或薄膜的厚度、复折射率等性质的一种光学方法，是一种高灵敏度、非破坏性的原位实时表征技术，被广泛应用于“电极/溶液”界面的研究. 本文简要介绍了椭圆偏振测量技术的基本原理及其最新发展，并着重评述了能源电化学、材料电化学、电分析与生物电化学等领域中，应用椭圆偏振测量技术研究“电极/溶液”界面的现状.

Ellipsometry is an optical technique with high-sensitivity to quantitatively obtain surface/interface properties such as thickness andrefractive index by analyzing the changes in polarized light reflected from the surface/interface. Its noncontacting and nondestructivenature makes it possible to acquire thein situreal-time information of the change at the surface/interface. Therefore, ellipsometry has been used widely in the electrochemical investigations. In this paper, based on the brief introduction of the measurementprinciple of ellipsometry, the current progress and the future trends of ellipsometry in electrochemistry arediscussed. The applications of ellipsometry in the fields of conversion and storage of electrochemical energy, electrochemistry ofmaterials science,electroanalysisand bioelectrochemistry are reviewed.