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研究论文

电沉积法制备用于一维纳米材料电子输运性质测量的基底

  • 刘进轩 ,
  • 向娟 ,
  • 田中群 ,
  • 毛秉伟
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  • 固体表面物理化学国家重点实验室厦门大学化学系,固体表面物理化学国家重点实验室厦门大学化学系,固体表面物理化学国家重点实验室厦门大学化学系,固体表面物理化学国家重点实验室厦门大学化学系 福建厦门361005 ,福建厦门361005 ,福建厦门361005 ,福建厦门361005

收稿日期: 2004-02-28

  修回日期: 2004-02-28

  网络出版日期: 2004-02-28

Substrates Made by Electrodeposition for Measuring Electrical Properties of One Dimensional Nanomaterials

  • LIU Jin-xuan ,
  • XIANG Juan~ ,
  • TIAN Zhong-qun ,
  • MAO Bing-wei Xiamen University
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Received date: 2004-02-28

  Revised date: 2004-02-28

  Online published: 2004-02-28

摘要

应用电沉积方法制备两种低粗糙度、具有导电/绝缘交接结构的测量基底—Au/CuO和HOPG/CuO,并在带导电针尖的原子力显微测量(CT_AFM)平台上建立了简便的一维纳米材料轴向电子输运性质测量方法.在大气室温条件下,对组装在两种基底上的单束碳纳米管轴向电学性质进行了定性测量,结果表明,该碳纳米管呈现金属性.

本文引用格式

刘进轩 , 向娟 , 田中群 , 毛秉伟 . 电沉积法制备用于一维纳米材料电子输运性质测量的基底[J]. 电化学, 2004 , 10(1) : 20 -26 . DOI: 10.61558/2993-074X.1540

Abstract

A method to prepare alternating conducting/insulating substrates by electrodeposition-oxidation was established to facilitate I-E measurements of one-dimensional nanomaterial by CT-AFM. The prepared Au/CuO and HOPG/CuO substrates showed low roughness as well as high uniformity of the alternating conducting/insulating structure, Qualitative I-E measurements were performed on a single carbon nanotube attached to the two above-mentioned substrates, both showing metallic characteristics at room temperature and in air.

参考文献

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