应用电沉积方法制备两种低粗糙度、具有导电/绝缘交接结构的测量基底—Au/CuO和HOPG/CuO,并在带导电针尖的原子力显微测量(CT＿AFM)平台上建立了简便的一维纳米材料轴向电子输运性质测量方法.在大气室温条件下,对组装在两种基底上的单束碳纳米管轴向电学性质进行了定性测量,结果表明,该碳纳米管呈现金属性.
A method to prepare alternating conducting/insulating substrates by electrodeposition-oxidation was established to facilitate I-E measurements of one-dimensional nanomaterial by CT-AFM. The prepared Au/CuO and HOPG/CuO substrates showed low roughness as well as high uniformity of the alternating conducting/insulating structure, Qualitative I-E measurements were performed on a single carbon nanotube attached to the two above-mentioned substrates, both showing metallic characteristics at room temperature and in air.
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