[1]Cao Chunan.Principles of electrochemistry of corrosion[M].Beijing:Chemical Industry Press,2008.
[2]Zhang Hongbao,Cong Wenbo.The electrochemical cor-rosion and protection of metal[M].Beijing:ChemicalIndustry Press,2005.
[3]Tian Zhaowu.The research method in electrochemistry[M].Beijing:Science Press,1984.
[4]Lin Changjian,Tian Zhaowu.Development of expei-mental method in electrochemistry[M].Xiamen:Xia-men University Press,1989.254.
[5]Lsaacs HS.Vyad B.Scanning reference electrode tech-niques in localized corrosion[M]//in Eds.F MansfildF,Bertocci U.Electrichemical Corrosion Testing,ATSM STP 727,1981.
[6]Lin Changjian(林昌健),Zhuo Xiangdong(卓向东),Tian Zhaowu(田昭武),et al.Study of localized corro-sion of metals by using the electrochemical techniqueswith spatial resolution[J].Electrochemistry(in Chi-nese),1999,5(1):25.
[7]Lin Changjian(林昌健),Zhuo Xiangdong(卓向东),Tian Zhaowu(田昭武),et al.Novel electrochemicaltechniques with spatial resolution and its applications inthe investigation of localized corrosion[J].Journal ofXiamen University(Natural Science)(in Chinese),2001,40(2):943.
[8]Lin Changjian(林昌健),Tian Zhaowu(田昭武).In-vestigation of the pitting corrosion of 18-8 stainless steelin early stage[J].Acta Physico-Chimica Sinica(in Chi-nese),1987,3(5):479-484.
[9]Lin Changjian(林昌健).In situ measurement of theCl-concentration distribution of metal surface[J].Cor-rosion Science and Protection Technology,1992,4(1):35-41.
[10]Martin A Edwards,Sophie Martin,Anna LWhitworth,et al.Scanning electrochemical microscopy:principlesand applications to biophysical systems[J].Physiolog-ical Measurement,2006,27:R63-R108.
[11]Kathrin Eckhard,Mathieu Etienne,Albert Schulte,etal.Constant-distance mode AC-SECM for the visuali-sation of corrosion pits[J].Electrochemistry Commu-nications,2007,9(7):1793-1797.
[12]Gabrielli C,Ostermann E,Perrot H,et al.Concentra-tion mapping around copper microelectrodes studied byscanning electrochemical microscopy[J].Electro-chemistry Communications,2007,7:962-968.
[13]Geraint Williams,Neil McMurray.Latent fingermarkvisualisation using a scanning Kelvin probe[J].Foren-sic Science International,2007,167:102-109.
[14]Castaldini A,Cavalcoli D,Cavallini A.Scanning Kel-vin probe and surface photovoltage analysis of multic-rystalline silicon[J].Materials Science and Engineer-ing,2002,B91-92:234-238.
[15]Binnig G,Rohrer H,Gerber Ch,et al.Tunnelingthrough a controllable vacuum gap[J].Appl PhysLett,1982,40:178-180.
[16]Binnig G,Rohrer H,Gerber Ch,et al.Surface stud-ies by scanning sunneling sicroscopy[J].Phys RevLett,1982,49:57-61.
[17]Eigler D M,Schweizer E K.Positioning single atomswith a scanning tunnelling microscope[J].Nature,1990,344:524-526.
[18]Gimzewskia J K,Stolla E,Schlittlera R R.Scanningtunneling microscopy of individual molecules of copperphthalocyanine adsorbed on polycrystalline silver sur-faces[J].Surface Science,1987,181:267.
[19]Cuberes M T,Schlittler R R,Gimzewski J K.Roomtemperature supramolecular repositioning at molecularinterfaces using a scanning tunneling microscope[J].Surface Science,1997,371:L231.
[20]Gimzewski J K,Jung TA,Cuberes MT,et al.Scan-ning tunneling microscopy of individual molecules:be-yond imaging[J].Surface Science,1997,386(1/3):101-114.
[21]Mitsuoka Y,Nakajima K,Homma K,et al.Polariza-tion properties of light emitted by a bent optical fiberprobe and polarization contrast in scanning near-fieldoptical microscopy[J].Journal of Applied Physics,1998,83(8):3998-4003.
[22]Nakajima K,Micheletto R,Mitsui K,et al.Hybrid-ization of scanning near-field optical microscope withscanning tunneling microscope[J].Molecular Crystalsand Liquid Crystals,1999,327:241-244.
[23]Heimel J,Fischer UC,Fuchs H.SNOM/STMusing atetrahedral tip and a sensitive current-to-voltage con-verter[J].Journal of Microscopy-oxford,2001,202:53-59.
[24]Gullo MR,Frederix Pltm,Akiyama T,et al.Charac-terization of microfabricated probes for combined atomicforce and high-resolution scanning electrochemical mi-croscopy[J].Analytical Chemistry,2006,78(15):5436-5442.
[25]Wiedemair J,Balu B,Moon J S,et al.,Plasma-de-posited fluorocarbon films:Insulation material for mi-croelectrodes and combined atomic force microscopy-scanning electrochemical microscopy probes[J].Ana-lytical Chemistry,2008,80(13):5260-5265.
[26]Davoodi A,Pan J,Leygraf C,et al.Integrated AFMand SECM for in situ studies of localized corrosion ofAl alloys[J].Electrochimica Acta,2007,52(27):7697-7705.
[27]Davoodi A,Pan J,Leygraf C,et al.The role of inter-metallic particles in localized corrosion of an aluminumalloy studied by SKPFM and integrated AFM/SECM[J].Journal of Electrochemical Society,2008,155(5):C211-C218.
[28]Femenia M,Canalias C,Pan J,et al.Scanning Kel-vin probe force microscopy and magnetic force micros-copy for characterization of duplex stainless steels[J].Journal of Electrochemical Society,2003,150(6):B274-B281.
[29]Lin Changjian(林昌健),Wei Baoming(魏宝明),Wang Ying(汪鹰),et al.Pitting corrosion and its in-hibition of rebar in alkaline solution containing chlorideions studied by reference electrode technique[J].Cor-rosion Science and Protection Technology,1998,10(3):135-139.
[30]Lin Changjian(林昌健),Luo Jingli(骆静利),DuRonggui(杜荣归),et al.Scanning combination of pHelectrode for in-situ pHimaging in the localized corro-sion[J].Electrochemistry(in Chinese),1996,2(4):372-377.
[31]Du Ronggui(杜荣归),Li Yan(李彦),Lin Changjian(林昌健),et al.Study on localized corrosion behav-ior of reinforcing steel by scanning microelectrode tech-nique[J].Journal of Building Materials,2008,11(1):33-37.
[32]Lin Yuhua(林玉华),Shao Minhua(邵敏华),DuRonggui(杜荣归),et al.Fabrication of scanning mi-cro Cl-probe and in-situ imaging of Cl-at the inter-face of 2024 Al alloy/solution[J].Electrochemistry(inChinese),2003,9(3):280-286.
