铜和金纳米线阵列上SCN-的表面增强拉曼光谱

电化学（中英文） ›› 1999, Vol. 5 ›› Issue (4): 371-376.

铜和金纳米线阵列上SCN-的表面增强拉曼光谱

姚建林,潘谷平,薛宽宏,谢泳,汤儆,任斌,孙冬梅,毛秉伟,田中群

厦门大学固体表面物理化学国家重点实验室!化学系厦门361005,南京师范大学化学系!南京210097,南京师范大学化学系!南京210097,厦门大学固体表面物理化学国家重点实验室!化学系厦门361005,厦门大学固体表面物理化学国家重点实验室!化学系厦门361005,厦门大学固体表面物理化学国

收稿日期:1999-11-28 修回日期:1999-11-28 出版日期:1999-11-28 发布日期:1999-11-28

Surface Enhanced Raman Spectroscopic study of SCN - adsorbed at the Copper and Gold Nanowire Arrays

Yao Jianlin a, Pan Guoping b, Xue Kuanhong b* , Xie Yong a, Tang Jing a, Ren Bin a, Sun Dongmei b,Mao Bingwei a, Tian Zhongqun a*

( a State Key Lab. for Phys. Chem. of Solid Surfaces, Dept. of Chem., Xiamen Univ., Xiamen 361005

Received:1999-11-28 Revised:1999-11-28 Published:1999-11-28 Online:1999-11-28

摘要/Abstract

Abstract: Two_dimensional arrays of Cu and Au nanowires have been fabricated by template synthesis method, using the anodic aluminum oxidation films as the template. The morphology of the nanowire array was monitored by atomic force microscope (AFM) in the dissolution processes of the alumina film. Based on the probe molecule strategy, the spectral feature of SCN - adsorbed at the Cu and Au nanowires with different diameters has been investigated by surface enhanced Raman spectroscopy (SERS). The results reveal that the intensity of the SERS bands depends on the length of the exposed nanowires. The C≡N stretching vibration frequency (ν CN ) of SCN - up_shifted significantly with the increase of the diameter of the nanowires in the range of 15 nm to 50 nm. This interesting phenomenon is briefly discussed.

Key words: Nanowires, SERS, AFM, SCN -, Cu

中图分类号:

O657.37

姚建林,潘谷平,薛宽宏,谢泳,汤儆,任斌,孙冬梅,毛秉伟,田中群. 铜和金纳米线阵列上SCN-的表面增强拉曼光谱[J]. 电化学（中英文）, 1999, 5(4): 371-376.

Yao Jianlin a, Pan Guoping b, Xue Kuanhong b* , Xie Yong a, Tang Jing a, Ren Bin a, Sun Dongmei b,Mao Bingwei a, Tian Zhongqun a* . Surface Enhanced Raman Spectroscopic study of SCN - adsorbed at the Copper and Gold Nanowire Arrays[J]. Journal of Electrochemistry, 1999, 5(4): 371-376.

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链接本文: https://electrochem.xmu.edu.cn/CN/

https://electrochem.xmu.edu.cn/CN/Y1999/V5/I4/371

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